The following is another excerpt from my forthcoming book. The working title is “MISSION IMPOSTER: The Remedy to Detect Counterfeit Electronic Components.”
In recent years many non authentic electronic microcircuits or clones were discovered to work electronically. The question to the electronics industry became just how long will these devices work?
Joseph Federico Vice President of NJMET, NJ illustrates the following synopsis of proper electrical testing protocols that should be exercised in testing a component for its functional and parametric performance.
The test objectives are to exercise the DC and AC Functional and Parametric requirements as indicated on the industry specifications. In cases of military, aerospace and space design, the respective subgroups contained in those documents would suffice for the objective tests. (See Group A Testing in an earlier post.)
Electrical Testing Illustration
|Commercial||0°C – 70°C||DC, AC Functional and Parametric Testing|
|Industrial||-40°C – +85°C||DC, AC Functional and Parametric Testing|
|Automotive||-45°C – +110°C||DC, AC Functional and Parametric Testing|
|Military / Aerospace||-55°C – +125°C||Subgroups 1, 2, 3, 4, 5, 6, 7, 8A, 8B. 9, 10, 11|
|Space||-65°C – +150°C||Subgroups 1, 2, 3, 4, 5, 6, 7, 8A, 8B. 9, 10, 11|
“As an example, for a DM74LS244 octal 3-state buffer/line driver/line receiver, a kelvin/continuity test is performed first to check pin contact. Following this initial check, supply current, then several input current tests as well as off state output current, short circuit output current and output voltage tests are performed to analyze the DC characteristics”, said Joseph Federico.
Once completed, various propogation times are measured along with performing the device’s functional test in order to analyse the A.C. characteristics.
“After testing electronic components for over thirty years I strongly feel that by exercising the proper testing methodologies above, the industry would have a more confident feeling on the distribution and performance of these products” said Federico.
For more information on Electrical Testing of Electronic Microcircuits, please call Joseph Federico at NJMET, NJ at (973) 546-5393. Please visit NJMET at www.njmetmtl.com